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Solder crack resistant/low-stress type
Low-stress substrate

Metal substrates are widely used in automotive electronics applications, incluiding electric power steering systems.
DENKA successfully developed a new insulating layer suitable for the high heat cycle resistance required in automotive electronics applications.

In conventional aluminum-based metal substrates, due to the difference in thermal expansion between the aluminum base plate and the mounted ceramic chips, heat cycle-induced cracking can occur in the solder joints.

DENKA optimized the insulating layer, eliminated or reduced solder cracking, and improved the heat cycle resistance of a solder by absorbing the difference in thermal expansion with the insulating layer.

Major applications of the EL-1 substrate

- Automotive electronics ECU (electric power steering systems (EPS), etc.)
- Others: applications requiring high heat cycle resistance property

Comparison of properties between the EL-1 substrate and other grades of substrates
Properties High thermal conductivity type
TH-1
General purpose type
K-1
Low-stress type
EL-1
Thermal conductivity (W/m.k) 4.0 2.0 2.5
Glass transition temperature (oC) 165 104 57
Insulating layer thickness (μm) 125 (Y-type) 100 (Y-type) 110
Thermal resistance (oC/W) 0.50 0.64 0.55
Peel strength (N/cm) 22.1 25.2 19.6
Insulation breakdown voltage (kV) 8.3 6.8 3.5
Heat cycle
Solder crack resistance
General properties of the insulating conductive layer of the EL-1 substrate
Thermal conductivity
(W/m.k)
Glass transition temperature
(℃)
Dielectric constant
(at 1 MHz)
Dielectric loss tangent
(at 1 MHz)
Volume resistance
(Ω.cm)
2.5 57 7.4 0.024 1x1015
High thermal conductivity insulating material (prototype)/Technical document
Characteristics of insulating material

We developed a high thermal conductivity insulating material TH-1 and are now developing insulating materials with even higher thermal conductivity.

Thermal resistance

The steady-state and transient thermal resistance of the high thermal conductivity insulation material (prototype) and the existing high thermal conductivity insulating material (TH-1) were measured.

2.1 Steady state
Steady-state thermal resistance was measured by the DKK method. As shown in Fig. 1, the high thermal conductivity insulating material (prototype) can significantly reduce thermal resistance.

2.2 Transient state
Transient thermal resistance was measured by the ΔVBE method. As shown in Fig. 2, the high thermal conductivity insulating material (prototype) can significantly reduce thermal resistance as in the steady state.

Reliability evaluation results (Al plate: 2.0 mm; copper foil: 105 μm; insulating layer thickness: 125 μm)

Table 2 shows the evaluation results of short and long-term reliability. The high thermal conductivity insulating material (prototype) is not as good as TH-1 in electrical strength, but shows no significant degradation in its properties.
The high thermal conductivity insulating material (prototype) is under mass-production testing. Please note that the values in the table may be changed.

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